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Boundary Scan Tester and Programmer
JTAGMaster
The JTAGMaster Tester and Programmer is designed to work with ABI's bespoke software - a multiple purpose platform which enables users to freely configure test procedures and instruments. Integrated functions are also available to the user to automatically learn the device status, provide pin-to-pin comparison and information as well as use some reporting facilities.
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Programmable Step Attenuator, DC to 50 GHz, 0 to 65 dB, 5 dB steps
84908M
Keysight now offers a family of higher frequency attenuators for your communications and aerospace applications. Combining low insertion loss with long life and excellent repeatability, these attenuators safeguard your test platform from failures, recalibration, downtime, and lost production.
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PCB Test System
Circuit Wizard - CW409
Qmax Test Technologies Pvt. Ltd.
CW 409 –Circuit Wizard PCB Test System has all the features of QT9627 such as Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test.Maximum Digital Test Speed 10MHz in the QT9627 .It can be connected to any PC/AT or Laptop with Windows 10 operating system through USB Plug and play interface. It operates on user friendly Qmax Test Director software platform with different modes like Test Station for operator level use Test Sequencer mode for Programmer level use and Interactive Workstation mode for quick working.
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Rapid PSE And Chained Data Test Of 4-Pair And 2-Pair PSE's
The optional PSL-3424-QT feature license opens up two important productivity tools in the PSL-3424 platform. PSL-3424 Quick Test is a fully automated PSE functional test covering between 2 and 8 PSE ports in a test cycle with average test times on the order of 10 seconds per port tested. The Chained Data Test user interface allows rapid construction and verification of test setups used in “snaked data path” testing of PSE’s with user specified loads and optional LLDP power negotiation on each test port.
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Probe Series
VEGA Series
MPI VEGA Prober series is ready to meet the diverse test and material handling requirements of the Laser Diode (VCSEL, EEL) and optical module markets. MPI VEGA probers are based on a highly flexible and reliable platform, enabling the test of a wide variety of device types (Wafer, Package & Singulated Die) over temperatures with the ability to handle thin/warped wafers. Multiple probing schemes are also supported with the ability to probe small pads with well-controlled needle force.
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Java Test Platform
JUnit 5
JUnit 5 is the next generation of JUnit. The goal is to create an up-to-date foundation for developer-side testing on the JVM. This includes focusing on Java 8 and above, as well as enabling many different styles of testing.
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Portable, Integrated O-Level Test Platform
Guardian™
Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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ICT - Flexible Multi-Core Parallel/Merged-Core Tester
TR5001 SII QDI SERIES
• Flexible Multi-Core Parallel / Merged-Core Tester• Serial Test Controller with up to 8 ports on any pin• Light - Curtain Protected Press - Down Platform• PXI Ready• Built-in Self Diagnostics and Auto-Calibration function• High-Accuracy Measurement• Flow - based Easy Program Development
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Semiconductor Test Platform
PAx
PAx semiconductor test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next-generation wireless standards.
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High Voltage DC Power Supply
IT6700H Series
IT6700H series high-voltage DC power supplies is with maximum output power 3000W, adjustable voltage 0-1200V and current 0-10A, IT6700H series have desktop and shelves installation function, easy to operate. IT6700H series provide list mode, built-in RS232 / USB / GPIB communication interface, rich SCPI instructions facilitate the formation of a variety of intelligent test platforms.
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Network Emulators
Rohde & Schwarz offers class-leading signaling testers. We established our position as leading supplier of LTE communications testers with the popular, all-in-one R&S®CMW500 platform. Now we are building on the expertise that enabled its success with the high-performance R&S®CMX500 radio communication tester.Secure the industry-leading wireless network emulators for your 5G NR and legacy technology challenges – from R&D design stages up to end-to-end application testing, production and conformance tests.
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100GbE Application and Security Load Module
PerfectStorm 100GE 1-Port Load Module
Keysight Network Applications and Security
PerfectStorm is a highly modular hardware test platform enabling equipment providers, service providers and enterprises the ability to create real-world, high-stress conditions and user behavior to push new equipment and networks to their limits.
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Modular Switch Matrices
L8990M Series
Keysight’s L8990M Modular Switch Matrices provide a cost effective and quick ship solution with a simple and flexible platform for basic RF switching. The L8990M can support up to 30 switch channels in a 2U rack-mountable enclosure with signal frequencies up to 67 GHz. It can support up to 66 switch channels in a 4U high enclosure. This provides the capability to test a wide range of RF and telecommunication products and devices.
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Sensor Solutions for IoT
Imec is a reference in the design of ultra-low power electronics, low-power algorithms to increase intelligence and data security, and in all aspects of data science. Our multi-sensor environmental monitoring platform features sensors for temperature, relative humidity, NO2, CO2, VOC (volatile organic compounds), particle matter, ambient light, sound, vibrations and presence detection. Our test platform is suitable for indoor and outdoor air quality monitoring and control, and can be used in smart buildings, smart cities and more.
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Test System Mainframe
ITC59000
The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
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Veracode Dynamic Analysis
DAST
Identify and Fix Critical Runtime Vulnerabilities in Web Applications and APIs.* Identify Vulnerabilities in Runtime Environments. Simultaneously scan hundreds of web apps and APIs to find vulnerabilities quickly - including pre-production and staging environments behind a firewall.*Prioritize and Fix Flaws Quickly, A <5% false positive rate allows teams to focus on the vulnerabilities that matter. Detailed, actionable remediation guidance means flaws are fixed faster.*Contribute to a Success...show more -
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Joint Services Electronic Combat Systems Tester
JSECST™
The Joint Services Electronic Combat Systems Tester (JSECST) is part of the family of testers, supporting the U.S. Air Force, Navy, Army, and over 23 allied nation platforms. JSECST performs full end-to-end diagnostic tests of installed systems including radar warning receivers (RWRs), jamming systems, communication systems, and navigation systems. Our JSECST delivers confidence for flight crews and the technicians who support them. It quickly and accurately tests and fault-isolates electronic combat and avionics systems for today's most advanced combat aircraft.
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Semiconductor Test Hardware Solutions
A critical element of every semiconductor test solution is the interface between the device and ATE. The hardware team at Test Spectrum has produced thousands of successful test interface solutions for some of the most challenging semiconductor products on all major ATE platforms. Our in-house team of PCB design experts has an added advantage of direct access to our senior test engineering staff.
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ULTRA® Contactors
ULTRA CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
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Flexible Test And Scan Solution For FFC Devices
Ismeca NY32W
32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for WLCSP and Bare Dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity.
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Embed functional-test
ScanWorks Embedded Diagnostics
The ScanWorks platform for embedded instruments is supported by a wide variety of hardware controllers and accessories with which engineers can connect ScanWorks to their unit under test (UUT). Hardware is available for development, production and repair environments. The test platform required for ScanWorks is either a standard PC or a system with a built-in (embedded) JTAG controller.
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Engineering Support Platform
ESP
ESP, or Engineering Support Platform, is a low cost, powerful and versatile platform for the development, deployment and support of FPGA Applications. ESP is powered by DSX core, ARC’s core element for the development and deployment of digital and mixed signal systems. The standard system contains 2 custom FPGA system, often configured in combination where one acts as the application firmware, and the other is used for test. But the system is expandable and configurable in any combination to sol...show more -
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Cloud-Based RF Signal Analysis Software
Cloud4Testing
Our next-generation software as a service (SaaS) platform is an ideal choice for your test and measurement needs. With the R&S®Cloud4Testing, you can enjoy a quick and easy access to Rohde & Schwarz testing essentials without having to make a big investment. Simply measure, analyze and process your individual RF data, on demand and on the go.
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Thermal Image Analysis Software
Thermalyze
Thermalyze software provides a stable platform from which to perform sophisticated temperature analysis and failure analysis testing. Tools such as Emissivity Tables allow you to perform true temperature mapping on the surface with varying emissivity. Lock-in thermography tests enable you to detect heating below 0.001°C.
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ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2-228X (Small IF) / 230540
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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VXI Chassis
The first VXIbus specification was introduced to the test and measurement community in 1987 and was initially developed to provide a card-based instrumentation platform for applications that required high density and high performance. The platform continues to thrive today by leveraging off the original specifications which define the necessary physical (real estate/cooling) and electrical standards for demanding applications and has established itself as the ‘time-tested bus you can trust’ for requirements that must be supported in excess of ten-fifteen years.
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ICT/FCT-Fixtures (Small IF)
GenRad CK-1-228X-S
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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TPS Development
Partech is an acknowledged leader in providing Test Solutions for the ADF, delivering high quality, indigenous in-country support for key defence platforms. Partech has developed Test Solutions for the following platforms:*S-70B-2 Seahawk operated by RAN*FA-18A/B Hornets operated by*RAAF*F35 Lightning II joint strike fighter
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Open Networking
We are committed to the ever changing world of Data Communication and Storage Networks. As the industry moves forward into Open Networking, we are keeping pace. Working closely with various Open Network organizations such as the Open Compute Project (OCP) and the Open Platform for NFV (OPNFV), we are leveraging years of experience of effecting positive change in the industry and creating robust test programs to enable markets.
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Semiconductor Testers
Cohu has 40+ years of expertise with semiconductor testers, designing and manufacturing scalable Automated Test Equipment (ATE) targeted at testing SOC, MCU, RF PA/FEM, Sensors/MEMS and Power and Analog devices. Our portfolio of instrumentation and our universal Automatic Test Equipment platform offers best-in-class solutions and enables faster time to yield.
